Snapshot Angle-Resolved Spectroscopy and Its Application for Study of Highly Efficient Polariton OLEDs

The multifunctional snapshot angle-resolved spectroscopy (ARS) system capable of electroluminescence, photoluminescence, and reflectance measurements for thin film devices is developed based on the k-space imaging technique. Compared with conventional goniometric ARS system, this offers great advantages rapid simple measurement, suitable characterizing that are unstable or degraded under long-time high-power driving conditions, such as OLEDs. We perform a detailed calibration show measured results closely match those obtained using system. Furthermore, we capabilities application in studying polariton result provides comprehensive information mode dispersion emission distribution, shows an effective radiative pumping lower branch high efficiency.